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interactive/fhs/arcmond2/external/include/arclibs.h
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biosvos 873193a243 base
2026-08-07 17:38:18 +09:00

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#ifndef _ARCLIBS_H
#define _ARCLIBS_H
/********************************************************/
/*
/* Data Structures & Function prototypes for S.M.A.R.T
/*
/********************************************************/
#include "arclib.h"
#ifdef __cplusplus
extern "C" {
#endif
#pragma pack(1)
#define MAX_DATA_LENGTH 512
#define SHORT_SELF_TEST 1
#define EXTENDED_SELF_TEST 2
/*
Attribute ID Numbers
Any non-zero value in the Attribute ID Number indicates an active attribute. The device supports the
following Attribute ID Numbers.
ID Attribute Name
=============================================
199 Ultra DMA CRC Error Count
198 Off-line Scan Uncorrectable Sector Count
197 Current Pending Sector Count
196 Reallocation Event Count
194 Temperature
193 Load Cycle Count
192 Power-off Retract Count
12 Device Power Cycle Count
10 Spin Retry Count
9 Power-on Hours Count
8 Seek Time Performance
7 Seek Error Rate
5 Reallocated Sector Count
4 Start/Stop Count
3 Spin Up Time
2 Throughput Performance
1 Raw Read Error Rate
0 Indicates that this entry in the data structure is not used
Status Flag definitions
Bit Definition
0 Pre-failure/advisory bit
0 An attribute value less than or equal to its corresponding attribute threshold indicates an
advisory condition where the usage or age of the device has exceeded its intended
design life period.
1 An attribute value less than or equal to its corresponding attribute threshold indicates a
pre-Failure condition where imminent loss of data is being predicted.
1 On-line Collective bit
0 The attribute value is updated only during Off-line testing.
1 The attribute value is updated during On-line testing or during both On-line and Off-line
testing.
2 - 5 Vendor specific
6 - 15 Reserved (0)
*/
/*
The following defines the 12 bytes that make up the information for each Attribute entry in the Device
Attribute Data Structure.
*/
typedef struct _DEVICE_ATTR_DATA // Individual Attribute Data Structure
{
BYTE id; // 0x00, Attribute ID Number (01h to FFh)
BYTE status[2]; // 0x01, Status flags
BYTE value; // 0x03, Attribute Value (valid values from 01h to FDh)
BYTE vendor_spec[8]; // 0x04, Vendor Specific
}sDEVICE_ATTR_DATA, *pDEVICE_ATTR_DATA; // total 12 bytes
/*
The following defines the 512 bytes that make up the Attribute Value information. This data structure is
accessed by the host in its entirety using the SMART Read Attribute Values subcommand. All multibyte
fields shown in these data structures are in byte ordering, that is, the least significant byte occupies the
lowest numbered byte address location in the field.
*/
typedef struct _SMART_ATTR_DATA // Device Attributes Data Structure
{
BYTE rev_num[2]; // 0x00 Data Structure Revision Number
sDEVICE_ATTR_DATA device_attr_data[30]; // 0x02 Device Attribute, from 1st~30th
BYTE dc_status; // 0x16A, Off¡Vline data collection status
BYTE st_status; // 0x16B, Self¡Vtest execution status
BYTE total_time_for_dc[2]; // 0x16C, Total time in seconds to complete off¡Vline data collection activity
BYTE vendor_spec1; // 0x16E, Vendor specific
BYTE dc_capability; // 0x16F, Off¡Vline data collection capability
BYTE smart_cap[2]; // 0x170, SMART capability
BYTE smart_error_log_cap; // 0x172, SMART device error logging capability
BYTE st_failure_check_point; // 0x173, Self¡Vtest failure check point
BYTE short_st_completion_time; // 0x174, Short self¡Vtest completion time in minutes
BYTE extended_st_completion_time; // 0x175, Extended self¡Vtest completion time in minutes
BYTE reserved[12]; // 0x176, Reserved
BYTE vendor_spec2[125]; // 0x182, Vendor specific
BYTE checksum; // 0x1FF, Data structure checksum
}sSMART_ATTR_DATA, *pSMART_ATTR_DATA; // total 512 bytes
/*
The following defines the 12 bytes that make up the information for each Threshold entry in the Device
Attribute Thresholds Data Structure. Attribute entries in the Individual Threshold Data Structure is in the
same order and correspond to the entries in the Individual Attribute Data Structure.
*/
typedef struct _DEVICE_ATTR_THRE_DATA // Individual Thresholds Data Structure
{
BYTE id; // 0x00, Attribute ID Number (01h to FFh)
BYTE threshold; // 0x01, Attribute Threshold
BYTE reserved[10]; // 0x02, Reserved (00h)
}sDEVICE_ATTR_THRE_DATA, *pDEVICE_ATTR_THRE_DATA; // total 12 bytes
/*
The following defines the 512 bytes that make up the Attribute Threshold information. This data structure
is accessed by the host in its entirety using the SMART Read Attribute Thresholds. All multibyte fields
shown in these data structures are in byte ordering, that is, the least significant byte occupies the lowest
numbered byte address location in the field.
The sequence of active Attribute Thresholds will appear in the same order as their corresponding
Attribute Values.
*/
typedef struct _SMART_ATTR_THRE_DATA // Device Attribute Thresholds Data Structure
{
BYTE rev_num[2]; // 0x00, Data Structure Revision Number
sDEVICE_ATTR_THRE_DATA device_attr_data[30]; // 0x02, Device Attribute, from 1st~30th
BYTE reserved[18]; // 0x16A, Reserved
BYTE vendor_spec[131]; // 0x17C, Vendor specific
BYTE checksum; // 0x1FF, Data structure checksum
}sSMART_ATTR_THRE_DATA, *pSMART_ATTR_THRE_THRE_DATA; // total 512 bytes
/*
Command data structure
Data format of each command data structure is shown below.
*/
typedef struct _COMMAND_DATA
{
BYTE dev_control_reg; // 0x00, Device Control register
BYTE features_reg; // 0x01, Features register
BYTE sector_count_reg; // 0x02, Sector count register
BYTE sector_number_reg; // 0x03, Sector number register
BYTE cylinder_low_reg; // 0x04, Cylinder Low register
BYTE cylinder_high_reg; // 0x05, Cylinder High register
BYTE head_reg; // 0x06, Device/Head register
BYTE command_reg; // 0x07, Command register
BYTE time_stamp[4]; // 0x08, Timestamp(ms from Power On)
}sCOMMAND_DATA, *pCOMMAND_DATA; // total 12 bytes
/*
Error data structure:
Data format of error data structure is shown below.
The state field contains a value indicating the device state when the command was issued to the device.
xBh-xFh Vendor specific
x5h-xAh Reserved
x4h SMART Off-line or Self-test
x3h Active/Idle
x2h Standby
x1h Sleep
x0h Unknown
Value
*/
typedef struct _ERROR_DATA
{
BYTE reserved; // 0x00, Reserved
BYTE error_reg; // 0x01, Error register
BYTE sector_count_reg; // 0x02, Sector count register
BYTE sector_number_reg; // 0x03, Sector number register
BYTE cylinder_low_reg; // 0x04, Cylinder Low register
BYTE cylinder_high_reg; // 0x05, Cylinder High register
BYTE head_reg; // 0x06, Device/Head register
BYTE status_reg; // 0x07, Status register
BYTE extended_error_data[19]; //0x08, Extended error data (vendor specific)
BYTE state; // 0x1B, State
BYTE life_timestamp[2]; // 0x1C Life timestamp (hours)
}sERROR_DATA, *pERROR_DATA; // total 30 bytes
/*
Error log data structure
Data format of error data structure is shown below.
*/
typedef struct _ERROR_LOG_DATA
{
sCOMMAND_DATA command_data[5]; // 0x00, Command data structure, from 1~5
sERROR_DATA error_data; // 0x3C, Error data structure
}sERROR_LOG_DATA, *pERROR_LOG_DATA; // total 90 bytes
/*
The following figure defines the 512 bytes that make up the SMART error log sector. All multibyte fields
shown in these data structures are in byte ordering.
*/
typedef struct _SMART_ERROR_LOG_SECTOR
{
BYTE version; // 0x00, SMART error log version
BYTE pointer; // 0x01, Error log pointer
sERROR_LOG_DATA log_data[5]; // 0x02, 1st~5th error log data structure
BYTE device_error_count[2]; // 0x1C4, Device error count
BYTE reserved[57]; // 0x1C6, Reserved
BYTE checksum; // 0x1FF, Data structure checksum
}sSMART_ERROR_LOG_SECTOR, *pSMART_ERROR_LOG_SECTOR; // total 512 bytes
/*
The data structure contains the descriptor of Self-test that the device has performed. Each descriptor is
24 bytes long and the self-test data structure is capable of containing up to 21 descriptors.
After 21 descriptors have been recorded, the oldest descriptor will be overwritten with a new descriptor.
The self-test log pointer points to the most recent descriptor. When there is no descriptor, the value is 0.
When there is descriptor(s) the value is 1 through 21.
*/
typedef struct _SELF_TEST_LOG_DESCRIPTOR
{
BYTE number; // 0x00, Self-test number
BYTE exe_status; // 0x01, Self-test execution status
BYTE life_time[2]; // 0x02, Life time power on hours
BYTE st_failure_check_point; // 0x04, Self-test failure check point
BYTE lba_of_first_failure[4];// 0x05, LBA of first failure
BYTE vendor_spec[15]; // 0x06, Vendor specific
}sSELF_TEST_LOG_DESCRIPTOR, *pSELF_TEST_LOG_DESCRIPTOR; // total 24 bytes
/*
Self-test log data structure
The following figure defines the 512 bytes that make up the Self-test log sector. All multibyte fields shown
in these data structures are in byte ordering.
*/
typedef struct _SELF_TEST_LOG_DATA
{
BYTE reversion[2]; // 0x00, Data structure revision
sSELF_TEST_LOG_DESCRIPTOR descriptor[21]; // 0x02, descriptors
BYTE vendor_spec[2]; // 0x1FA, Vendor specific
BYTE pointer; // 0x1FC, Self-test log pointer
BYTE reserved[2]; // 0x1FD, Reserved
BYTE checksum; // 0x1FF, Data structure checksum
}sSELF_TEST_LOG_DATA, *pSELF_TEST_LOG_DATA; // total 512 bytes
#ifdef _WIN32
class ARCLIB_API CArclibSMART : public CArclib
{
#else
class CArclibSMART : public CArclib
{
#endif
public:
// (O): Implemented
// (X): Not Implemented
enum
{
R_SMART_DATA = 0, // (O)Read smart data
R_THLD_DATA, // (O)Read threshold data
ED_AUTOSAVE, // (X)Enable/disable autosave
S_ATTR, // (X)Save attribute
EXE_OFFLINE, // (O)Execute offline
R_LOG, // (X)Read log
W_LOG, // (X)Write log
RESERVED1,
E_SMART, // (O)Enable SMART
D_SMART, // (O)Disable SMART
RET_SMART_STATUS, // (X)Return SMART status
ED_AUTO_OFFLINE, // (X)Enable/Disable automatic offline
RESERVED2,
RESERVED3,
RESERVED4,
RESERVED5,
RW_TEST, // (O)Read/Write test
STOP_RW_TEST, // (O)Stop Read/Write test
CHECK_RW_RESULT, // (O)Check Read/Write Result
RESERVED6
};
//################################################################################################
// Function: ArcExeSMART
// Parameters: (i) cmd: the commands listed above
// (i) drv: drive# where the SMART command is being executed
// (i) params: The options for EXE_OFFLINE, RW_TEST only.
// for EXE_OFFLINE: value SHORT_SELF_TEST indicates short self-test
// value EXTENDED_SELF_TEST indicates extended self-test
// for RW_TEST: percentage of RW_TEST
// (o) data: The option for R_SMART_DATA, R_THLD_DATA, CHECK_RW_RESULT only.
// the SMART data returned from the drive that indicates by drv,
// the memory allocation of 'data' is the responsibility of the
// calling thread, and it's size should be >= 512 bytes
//################################################################################################
ARC_STATUS ArcExeSMART(int cmd, BYTE drv, BYTE params, PBYTE data);
};
#pragma pack()
#ifdef __cplusplus
}
#endif
#endif
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